- Country: Czech Republic
- Summary: Xenon Focused Ion Beam Electron Microscope
- CZT Ref No: 98100333
- Deadline: 04 Mar 2025
- Financier: Self Financed
- Purchaser Ownership: Government
- Tender Value: CZK 55890000
- Notice Type: Tender
- Document Ref. No.: 131181-2024
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- Description:
- The subject of the contract is a double-beam electron microscope with a xenon focused ion beam (dual beam) SEM/PFIB in an assembly according to technical specifications. Analytical equipment for the EDS, EBSD and SIMS methods is part of the set in demand.
SEM/PFIB microscope with all supporting equipment (hereinafter referred to as "system") is delivered in such a configuration that guarantees the full functionality of the unit and all its parts, i.e. all necessary auxiliary devices are part of the delivery and their mutual cooperation is guaranteed.
The system also contains sufficient safety measures to protect the microscope, its vacuum system and elektronics from serious damage in the event of a sudden interruption of the power supply, failure of the water cooling (if used) and the vacuum pumping system. If the system is not inherently safe from destruction of the electron and ion source upon loss of vacuum, then the vacuum system must maintain safetynew pressure level in the critical parts of the tube for at least 30 minutes.
If a backup power supply (UPS) with a power greater than 4.8 kW is needed to ensure the emergency function, i.e. to ensure the safe state of the source of electrons and ions (see paragraph 2 ), this will be part of the delivery. Backup source in that casewill guarantee the maintenance of safe conditions for at least 12 hours. Due to the limited space in the available technical room, it is further required that the UPS, including the battery modules, can be installed in the existing 19" cabinet with a depth of 800 mm. The free space in the cabinet has a height of 10 U (rack un... - Documents:
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CLICK HERE TO LOGINXenon Focused Ion Beam Electron Microscope - Czech Tender
The TECHNICAL UNIVERSITY BRNO, a Government sector organization in Czech Republic, has announced a new tender for Xenon Focused Ion Beam Electron Microscope. This tender is published on CzechTenders under CZT Ref No: 98100333 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2025-03-04.
The estimated tender value is CZK 55890000, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.
